Silicon AFM probes, contact

The Contact series silicon AFM probes for contact mode and pulse force mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. They feature alignment grooves for correct holding and calibration of probes (alignment grooves do not affect the AFM probe in systems that do not require this feature).See images for AFM probes coatings and application information.Technical Data: ContactRotated monolithic silicon probeSymmetric tip shapeAlignment grooves or noneChip size 3.4 x 1.6 x 0.3mm

The Contact series silicon AFM probes for contact mode and pulse force mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. They feature alignment grooves for correct holding and calibration of probes (alignment grooves do not affect the AFM probe in systems that do not require this feature).

See images for AFM probes coatings and application information.

Technical Data: Contact

• Rotated monolithic silicon probe
• Symmetric tip shape
• Alignment grooves or none
• Chip size 3.4 x 1.6 x 0.3mm

	Value	Range
Resonant Freq.	13 kHz	+/-4 kHz
Force Constant	0.2 N/m	0.07-0.4 N/m
Length	450 µm	+/-10 µm
Mean Width	50 µm	+/-5 µm
Thickness	2 µm	+/-1 µm
Tip Height	17 µm	+/-2 µm
Tip Set Back	15 µm	+/-5 µm
Tip Radius	<10 nm (G, AL-G, GD-G, GB) <25nm (Electri) <15nm (DLC)
Half Cone Angle	20°-25° along cantilever axis 25°-30° from side 10°-at the apex
Contact Resistance	300ohms on platinum thin film surface