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AFM probes, silicon nitride
The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).Technical Data: SiNiCr/Au Reflex (C-GD) is coated with 70nm thick Chromium/GoldApplication for several measurement modes4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge TipSilicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm
The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).
Technical Data: SiNi
- Cr/Au Reflex (C-GD) is coated with 70nm thick Chromium/Gold
- Application for several measurement modes
- 4 Silicon Nitride Cantilevers (Triangular, 2 different lengths)
- Silicon Nitride Wedge Tip
- Silicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm
|
Short Cantilever |
Long Cantilever | Range | |
| Resonant Freq. | 45 kHz | 12.6 kHz | - |
| Force Constant | 0.27 N/m | 0.06 N/m | - |
| Length | 100 µm | 200 µm | +/-10 µm |
| Mean Width | 16 µm | 30 µm | +/-5 µm |
| Thickness | 520 µm |
+/-50 µm |
|
| Tip Height | 12 µm (overall) >450nm (effective) |
+/-2 µm 450-550 nm |
|
| Tip Set Back | 4.5 µm |
+/-0.5 µm |
|
| Tip Radius | <15 nm | ||
| Half Cone Angle | 35° (macroscopic) | ||
| Cantilever Bending | Typically 3°, max 7° | ||
Please choose carefully. Returns of this item are subject to approval.
| Code | Title | Coating | Pack Size | Availability | Price | Updated: 27-04-2024 |
|---|---|---|---|---|---|---|
| GTPSINI-30 | AFM probes, silicon nitride | Cr/Au reflex coating | Pack/50 | 3 weeks | Quote only | Quote |
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| GTPSINI-100 | AFM probes, silicon nitride | Cr/Au reflex coating | Pack/100 | 3 weeks | Quote only | Quote |
| Quote | ||||||
| GTPSINI-300 | AFM probes, silicon nitride | Cr/Au reflex coating | Pack/300 | 3 weeks | Quote only | Quote |
| Quote | ||||||
