SEM low profile 45/90 deg. specimen mounts, pin mount
The SEM low profile 45/90° specimen mount is cut to allow advantag...
SEM specimen mounts, pin mount
The SEM specimen mount is made of aluminium with a grooved edge and 3.2mm diameter pin stub. C...
Pyrolytic carbon grids, single hole
Specimen support with low X-ray background, approximately 0.2mm thick.The grids are 3mm O....
KPFM-EFM calibration standard
A test and calibration standard for Electrostatic Force and Kelvin Probe atomic force microsco...
PELCO Faraday cup
The PELCO Faraday Cup allows for precise measurement of the beam current on SEM, MicroProbe or...
SEM 90 deg. pin mount holder, M4 cylinder
Intended for cross-section work and planar FIB applications, this holder accepts standard 12.7...
FIB lift-out grids for inverted sample preparation
Three post molybdenum grids with an extended rim which allows the grid to be held in an invert...
FIB AutoGrid rings and C-clips
NanoSoft's patent (pending) FIB AutoGrid Rings are a superior alternative for clipping FIB gri...
PELCO SEMClamp bar specimen vices, M4 cylinder
The PELCO Bar clamp vices is available in three lengths; 102mm, 152mm and 203mm with the same ...
PELCO lacey carbon film coated NetMesh grids
Lacey Carbon Films with No Formvar: Holes are completely open, 400 mesh, copp...
NanoSoft clipping tools
NanoSoft’s Clipping Tool is compatible with the Thermo Fisher clipping station and is loaded w...
NanoSoft clipping station
NanoSoft's Clipping Station provides unmatched ease of use and efficiency for the clipping of ...
Retainers for ultra high vacuum reference standards
Retainers for Ultra High Vacuum Compatible Micro and Macro Analysis Standard for Surface &...
Plastic embedding sample clips
Plastic clips for holding up to three or four small and thin sections such as sheet metal or p...
Ultra-flat silicon wafer, type <100>
Ultra-Flat silicon wafer for demanding substrate studies. Can also be used as substrate for AF...
Quantifoil UltrAuFoil 0.6/1 holey gold film coated grids, square array
UltrAuFoil holey gold sample supports have become recognised as the optimum choice to maximise...
Quantifoil UltrAuFoil 1.2/1.3 holey gold film coated grids, square array
UltrAuFoil holey gold sample supports have become recognised as the optimum choice to maximise...
Quantifoil UltrAuFoil 2/2 holey gold film coated grids, square array
UltrAuFoil holey gold sample supports have become recognised as the optimum choice to maximise...
Sputter target, iridium
High purity 57mm diameter Targets, Iridium Target, 99.8% Ir (ø57mm x 0.3mm), compatible with:<...
SEM fibre vice mount, M4 cylinder
This spring-closing vice mount allows for easy clamping and tilting of small rod or fibre samp...
SEM fibre vice mount, pin mount
This spring-closing vice mount allows for easy clamping and tilting of small rod or fibre samp...
PELCO low profile FIB sample and grid holders
The PELCO Single and Double FIB Sample and Grid Holders hold FIB samples mounted on a pin stub...
PELCO SEMClip low profile 45/90 deg. specimen mount, M4 cylinder
These PELCO SEMClip low profile specimen M4 cylinder mounts are designed for easy, quick and c...
PELCO SEMClip low profile 45/90 deg. specimen mount, pin mount
These PELCO SEMClip low profile specimen pin mounts are designed for easy, quick and clean mou...
SEM low profile double pre-tilt FIB mounts, short pin mount
These SEM low profile double pre-tilt mounts are made of aluminium at set pre-tilt angles for ...
Tungsten filaments, AEI base
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Tungsten filaments, ETEC
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Tungsten filaments, ISI/ABT/Topcon
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Tungsten filaments, AMRAY
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Tungsten filaments, Hitachi cartridge
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Tungsten filaments, Hitachi
Tungsten hairpin filaments are the standard type filaments widely used in Scanning Electron Mi...
Multi calibration standard for desktop SEM
Combined standard for resolution, magnification calibration, and EDS performance monitoring. S...
Highly uniform 30nm gold spheres on vitreous carbon
These samples have a random dispersion of highly uniform diameter gold spheres drop-cast on mi...
PELCO image tabs, carbon conductive tabs
The thicker PELCO Image Tabs is a stiff 260µm thick smooth conductive tab. Though not as condu...
PELCO SEM specimen sample clamps
The PELCO SEM specimen clamps are designed to hold samples during preparation and mounting inc...
Disc apertures, platinum, type B
These EM disc apertures made from platinum-iridium (95:5) are type B (70-90 degree window) and...
PELCO silicon aperture frames
The PELCO silicon aperture frames are 3mm disc type frames with a thickness of 200µm and squar...
PELCO X-CHECKER SEM calibration x-ray wafer references
The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling. The PELC...
PELCO silicon nitride X-ray windows, square
The new X-Ray Windows feature larger frames and apertures and are made to the from $302.00
Metal spring mounting and embedding clips
Spring clips, ideal for holding thin samples for cross sectioning. Can be used for hot and col...
Silicon nitride support film, 15nm
The PELCO Silicon Nitride Support Films for TEM have been developed as an addition to our exte...
Ultra-flat SiNx coated silicon wafers, 200nm
The Ultra-Flat SiNx Substrates consist of ultra-flat silicon wafers coated with 200nm of amorp...
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 1um, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 1um, certified to NIST:...
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm-1um, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm-1um, traceable to NIST:Pe...
Conductive Lift-N-Press adhesive tabs, double sided
Composed of a thin film of strong conductive adhesive approx. 12.7mm diameter on one side and ...
PELCO SEM 70 deg. microscope slide mount, M4 cylinder
The PELCO SEM 70° microscope slide holder mount is ideal for EBSD and has a M4 threaded base. ...
PELCO SEM 70 deg. microscope slide mount, pin mount
The PELCO SEM 70° microscope slide holder mount is ideal for EBSD and has a 3.2mm diameter pin...
PELCO SEM 70 deg. vice mount holder and specimen mount, pin mount and M4 cylinder
The PELCO SEM 70° vice specimen mount is ideal for EBSD and has a removable 3.2mm diameter pin...
