PELCO X-CHECKER B SEM calibration x-ray references
PELCO X-CHECKER B SEM calibration x-ray references - Monitor Energy Dispersive Spectromete...
PELCO X-CHECKER EXTRA SEM calibration x-ray references
PELCO X-CHECKER EXTRA SEM calibration x-ray references - Monitor Energy Dispersive Spectro...
PELCO X-CHECKER SEM calibration x-ray references
PELCO X-CHECKER SEM calibration x-ray references - Monitor Energy Dispersive Spectrometer/...
PELCO X-CHECKER SEM calibration x-ray wafer references
The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling. The PELC...
Pelcotec CDMS calibration standards, 2mm - 100nm
The Pelcotec critical dimension magnification standard (CDMS) calibration standards are availa...
Pelcotec CDMS calibration standards, 2mm - 1µm
The Pelcotec critical dimension magnification standard (CDMS) calibration standards are availa...
Pelcotec CDMS-XY 2-axis calibration standards, 2mm - 100nm
The Pelcotec critical dimension magnification standard (CDMS-XY) 2-axis calibration standards ...
Pelcotec CDMS-XY 2-axis calibration standards, 2mm - 1μm
The Pelcotec critical dimension magnification standard (CDMS-XY) 2-axis calibration standards ...
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, certified to NIST
Pelcotec CDMS ISO Critical Dimensions and Magnification Standards are easy to use and very us...
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, traceable to NIST
Pelcotec CDMS ISO Critical Dimensions and Magnification Standards are easy to use and very us...
Pelcotec ISO CDMS calibration standards, 2mm - 1um, certified to NIST
Pelcotec CDMS ISO Critical Dimensions and Magnification Standards are easy to use and very us...
Pelcotec ISO CDMS calibration standards, 2mm-1um, traceable to NIST
Pelcotec CDMS ISO Critical Dimensions and Magnification Standards are easy to use and very us...
Pelcotec SEM magnification calibration standard, G-1 silicon
The Pelcotec? G-1 calibration specimen with a 1µm pitch grid is very useful for magnification ...
Planotec GSR and particle analysis calibration kit
Planotec GSR and Particle Analysis Calibration KitKit contains two test specimens: o...
Planotec SEM magnification calibration standard, silicon, unmounted
The Planotec silicon calibration specimen is ideal for magnification calibration or image dist...
Planotec silicon test specimen, mounted
The Planotec silicon calibration specimen is useful for magnification calibration or image dis...
SEM Low magnification calibration ruler, unmounted
100 markings with divisions of 0.01mm, on a nickel-plated copper disc.Used for low-mag che...
SEM Resolution test standard, tin on carbon disc, high magnification
Tin dispersed on the surface of a carbon substrate supported by a 3mm tabbed copper slot grid ...
SEM Resolution test standard, tin on carbon disc, medium magnification
SEM Resolution test standards, tin on carbon disc for medium magnification. Tin spheres on car...
SEM resolution test standards, gold on carbon
The widely used gold on carbon test specimens are excellent for SEM, FESEM and FIB resolution ...
SEM tin on carbon disc resolution standards, medium magnification
Dispersion of tin spheres, the majority being within the size range of 10nm to 100nm, on a car...
SEM tin on carbon disc resolution standards, wide magnification range
Dispersion of tin spheres on a carbon substrate that is 6.15mm diameter x 2.2mm thickness. App...
SEM tin on carbon on grid resolution standards, high magnification
Tin dispersed on the surface of a carbon substrate supported by a 3mm tabbed copper slot grid ...
SEM tin spheres on carbon resolution standards, low magnification
Size ranging from 1-10um for table top SEMs and low magnification testing of SEM...
XCS EDS/BSD calibration standard
The XCS EDS calibration standards are practical, high quality and compact EDS calibration stan...
