Highly uniform 30nm gold spheres on vitreous carbon
These samples have a random dispersion of highly uniform diameter gold spheres drop-cast on mi...
PELCO Faraday cup
The PELCO Faraday Cup allows for precise measurement of the beam current on SEM, MicroProbe or...
PELCO magnification calibration diffraction grating replica, cross line grating
Carbon grating replica with Au/Pd shadowing on a cross line grating with well-defined trench t...
PELCO magnification calibration diffraction grating replica, waffle grid
Carbon replicas with Au/Pd shadowing of diffraction line gratings, parallel line, waffle patte...
PELCO magnification calibration diffraction grating replicas, latex spheres
These diffraction grating replica and latex calibration standards are a two-in-one for TEM/STE...
PELCO multi calibration standard for desktop SEM
Combined standard for resolution, magnification calibration, and EDS performance monitoring. S...
PELCO SEM low magnification calibration disc, unmounted
100 markings with divisions of 0.01mm, on a nickel-plated copper disc.Used for low-mag che...
PELCO SEM low magnification resolution standards, tin spheres on carbon
Size ranging from 1-10µm for table top SEMs and low magnification testing of SEM, FESEM and FI...
PELCO TEM/STEM diffraction standard for camera length, evaporated aluminium
The nominal value of the effective camera length of an EM operating in the selected area mode ...
PELCO TEM/STEM diffraction standard for image rotation, molybdenum trioxide
When changing from a selected area image of a specimen to a diffraction pattern, the strength ...
PELCO X-CHECKER B SEM calibration x-ray references
PELCO X-CHECKER B SEM calibration x-ray references - Monitor Energy Dispersive Spectrometer/SE...
PELCO X-CHECKER EXTRA SEM calibration x-ray references
PELCO X-CHECKER EXTRA SEM calibration x-ray references - Monitor Energy Dispersive Spectromete...
PELCO X-CHECKER SEM calibration x-ray references
PELCO X-CHECKER SEM calibration x-ray references - Monitor Energy Dispersive Spectrometer/SEM ...
PELCO X-CHECKER SEM calibration x-ray wafer references
The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling. The PELC...
PELCO XCS EDS/BSD calibration standard
The XCS EDS calibration standards are practical, high quality and compact EDS calibration stan...
Pelcotec CDMS calibration standards, 2mm - 100nm
The Pelcotec critical dimension magnification standard (CDMS) calibration standards are availa...
Pelcotec CDMS calibration standards, 2mm - 1µm
The Pelcotec critical dimension magnification standard (CDMS) calibration standards are availa...
Pelcotec CDMS-XY 2-axis calibration standards, 2mm - 100nm
The Pelcotec critical dimension magnification standard (CDMS-XY) 2-axis calibration standards ...
Pelcotec CDMS-XY 2-axis calibration standards, 2mm - 1μm
The Pelcotec critical dimension magnification standard (CDMS-XY) 2-axis calibration standards ...
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 100nm, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 1um, certified to NIST
Pelcotec ISO CDMS calibration standards, 2mm - 1µm, certified to NIST:...
Pelcotec ISO CDMS calibration standards, 2mm-1um, traceable to NIST
Pelcotec ISO CDMS calibration standards, 2mm-1µm, traceable to NIST:Pe...
Pelcotec SEM finder grid substrate, silicon SFG12
The innovative Pelcotec SFG12 finder grid substrate is a flat, conductive silicon substrate wi...
Pelcotec SEM magnification calibration standard, G-1 silicon
The Pelcotec G-1 calibration specimen with a 1µm pitch grid is very useful for magnification c...
Planotec GSR and particle analysis calibration kit
Kit contains two test specimens: one with synthetic GSR particles and one with synthetic parti...
Planotec SEM magnification calibration standard, silicon, unmounted
The Planotec silicon calibration specimen is ideal for magnification calibration or image dist...
Planotec silicon test specimen, mounted
The Planotec silicon calibration specimen is useful for magnification calibration or image dis...
Retainers for ultra high vacuum reference standards
Retainers for Ultra High Vacuum Compatible Micro and Macro Analysis Standard for Surface and X...
SEM E-Beam lithography specimen mount, M4 cylinder
The E-Beam Lithography Mount is mounted on a 25mm aluminium cylinder stub positioned in such a...
SEM E-Beam lithography specimen mount, pin mount
The E-Beam Lithography specimen mount comes with 2 PELCO SEMClips to secure the sample, a Fara...
SEM finder grid, copper
The SEM finder grid is made from copper and can be mounted on an SEM mount ideal for particle ...
SEM finder grids, SEMF2
The SEM finder & locator grids for specimen mount, SEMF2 has been developed to mount on 12...
SEM finder grids, SEMF3
The SEM finder grids for specimen mount, SEMF3 is designed to be mounted on a 12.7mm diameter ...
SEM finder grids, tapered arms
The SEM finder & locator grid for specimen mount is designed for use with large specimens ...
SEM high magnification resolution grid standards, tin on carbon disc
Tin dispersed on the surface of a carbon substrate supported by a 3mm tabbed copper slot grid ...
SEM medium magnification resolution standards, tin on carbon disc
Dispersion of tin spheres, the majority being within the size range of 10nm to 100nm, on a car...
SEM resolution test standards, gold on carbon
The widely used gold on carbon test specimens are excellent for SEM, FESEM and FIB resolution ...
SEM wide magnification resolution standards, tin on carbon disc
Dispersion of tin spheres on a carbon substrate that is 6.15mm diameter x 2.2mm thickness. App...
