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KPFM-EFM calibration standard
A test and calibration standard for Electrostatic Force and Kelvin Probe atomic force microscopy modes. Sample consists of arrays of aluminium and Gold lines deposited on oxide-covered silicon. Thin copper wires are connected to the Al and Au contact pads, allowing a specified electric field to be applied between the lines.
- Line arrays with 8, 20, and 40µm pitch
- Line height of ~35nm
- Mounted version is on 15mm glass on a standard 15mm AFM disc with thin copper wires connected to the Al and Au bond pads on each side of the die
- Unmounted version is die only, no substrate or wires
Available:
| Code | Description |
|---|---|
| GTP629 | Kelvin Probe (KPFM) and Electronic Force (EFM) Probe Standard, unmounted |
| GTP629-AFM | Kelvin Probe (KPFM) and Electronic Force (EFM) Probe Standard, mounted on 15mm mount with wires |
* Availability Explanation
X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
In Stock – Plenty of stock on the shelf, ready to ship.
No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.
