Silicon AFM probes, All-In-One

The All-In-One series silicon AFM probes with four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. Made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200nm. Available with tip and without tip (tipless).See images for AFM probes coatings and application information.Technical Data: All-In-OneRotated Monolithic Silicon ProbeSymmetric Tip ShapeChip size: 3.4 x 1.6 x 0.3mm

The All-In-One series silicon AFM probes with four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. Made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200nm. Available with tip and without tip (tipless).

See images for AFM probes coatings and application information.

Technical Data: All-In-One

  • Rotated Monolithic Silicon Probe
  • Symmetric Tip Shape
  • Chip size: 3.4 x 1.6 x 0.3mm
        Cantilever A
Cantilever B
Cantilever C
Cantilever D
Application Contact Mode
Force modulation,
Pulsed Force Mode
Soft Tapping Mode, Intermittent Contact-Mode
Tapping Mode, Intermittent Contact-Mode
Similar type Contact Multi75 Tap150 Tap300

Values Range Values Range Values Range Values Range
Resonant freq. (kHz) 15 ±5  80 ±30
150 ±80
350 ±150
Force constant  (N/m) 0.2 0.04-0.07 2.7 0.4-10 7.4 1-29 40 7-160
Length (µm) 500 ±10
210 ±10
150 ±10
100 ±10
Mean width              (µm) 30 ±5
30 ±5
30 ±5
50 ±5
Thickness (µm) 2.7 ±1
2.7 ±1
2.7 ±1
2.7 ±1
Tip height (µm) 17 (±2)
Tip set back (µm) 15 (±5)
Tip radius

< 10nm (G, AL-G), <25nm (Electri, DLC)

Half cone angle 20°-25° along cantilever axis,  25°-30° from side, 10°-at the apex
Updated: 22-01-2025
Code Title Coating Pack Size Availability Price Updated: 22-01-2025
GTPAIO-10 Silicon AFM probes, All-In-One None Pack/10 3 weeks P.O.R. Quote
GTPAIO-50 Silicon AFM probes, All-In-One None Pack/50 3 weeks P.O.R. Quote
GTPAIOAL-10 Silicon AFM probes, All-In-One Aluminium reflex coating Pack/10 3 weeks P.O.R. Quote
GTPAIOAL-50 Silicon AFM probes, All-In-One Aluminium reflex coating Pack/50 3 weeks P.O.R. Quote
GTPAIOAL-TL-10 Silicon AFM probes, All-In-One Aluminium reflex coating (tipless) Pack/10 3 weeks P.O.R. Quote
GTPAIOAL-TL-50 Silicon AFM probes, All-In-One Aluminium reflex coating (tipless) Pack/50 3 weeks P.O.R. Quote
GTPAIO-DLC-10 Silicon AFM probes, All-In-One DLC coating Pack/10 3 weeks P.O.R. Quote
GTPAIO-DLC-50 Silicon AFM probes, All-In-One DLC coating Pack/50 3 weeks P.O.R. Quote
GTPAIOE-10 Silicon AFM probes, All-In-One Conductive Cr/Pt Coating Pack/10 3 weeks P.O.R. Quote
GTPAIOE-50 Silicon AFM probes, All-In-One Conductive Cr/Pt Coating Pack/50 3 weeks P.O.R. Quote
GTPAIO-TL-10 Silicon AFM probes, All-In-One None (tipless) Pack/10 3 weeks P.O.R. Quote
GTPAIO-TL-50 Silicon AFM probes, All-In-One None (tipless) Pack/50 3 weeks P.O.R. Quote

* Availability Explanation

X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.

In Stock – Plenty of stock on the shelf, ready to ship.

No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.