PELCO X-CHECKER SEM calibration x-ray references

PELCO X-CHECKER SEM calibration x-ray references - Monitor Energy Dispersive Spectrometer/SEM Systems

The updated PELCO X-CHECKER is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. It contains a series of standard materials on your choice of aluminium mount, to check detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software.

Includes:

• Manganese to measure full width at half max (FWHM) detector resolution
• Aluminium and copper to check spectral calibration
• Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
• Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window

Instruction booklet and storage case included.

SEM mount selections Type A-R: Technical Data