AFM probes, silicon nitride

The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).Technical Data: SiNiCr/Au Reflex (C-GD) is coated with 70nm thick Chromium/GoldApplication for several measurement modes4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge TipSilicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm

The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).

Technical Data: SiNi

  • Cr/Au Reflex (C-GD) is coated with 70nm thick Chromium/Gold
  • Application for several measurement modes
  • 4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) 
  • Silicon Nitride Wedge Tip
  • Silicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm
        Short Cantilever
Long Cantilever Range
Resonant Freq. 45kHz 12.6kHz -
Force Constant  0.27N/m 0.06N/m -
Length 100µm 200µm ±10µm
Mean Width               16µm 30µm ±5µm
Thickness  520µm
±50µm
Tip Height 12µm (overall)
>450nm (effective)
±2µm
450-550nm
Tip Set Back 4.5µm
±0.5µm
Tip Radius <15nm 
Half Cone Angle 35° (macroscopic)
Cantilever Bending Typically 3°, max 7°
Updated: 27-12-2024
Code Title Coating Pack Size Availability Price Updated: 27-12-2024
GTPSINI-30 AFM probes, silicon nitride Cr/Au reflex coating Pack/50 3 weeks P.O.R. Quote
GTPSINI-100 AFM probes, silicon nitride Cr/Au reflex coating Pack/100 3 weeks P.O.R. Quote
GTPSINI-300 AFM probes, silicon nitride Cr/Au reflex coating Pack/300 3 weeks P.O.R. Quote

* Availability Explanation

X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.

In Stock – Plenty of stock on the shelf, ready to ship.

No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.