AFM probes, silicon nitride

The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).Technical Data: SiNiCr/Au Reflex (C-GD) is coated with 70nm thick Chromium/GoldApplication for several measurement modes4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge TipSilicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm

The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).

Technical Data: SiNi

  • Cr/Au Reflex (C-GD) is coated with 70nm thick Chromium/Gold
  • Application for several measurement modes
  • 4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) 
  • Silicon Nitride Wedge Tip
  • Silicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm
        Short Cantilever
Long Cantilever Range
Resonant Freq. 45kHz 12.6kHz -
Force Constant  0.27N/m 0.06N/m -
Length 100µm 200µm ±10µm
Mean Width               16µm 30µm ±5µm
Thickness  520µm
±50µm
Tip Height 12µm (overall)
>450nm (effective)
±2µm
450-550nm
Tip Set Back 4.5µm
±0.5µm
Tip Radius <15nm 
Half Cone Angle 35° (macroscopic)
Cantilever Bending Typically 3°, max 7°
Code Title Coating Pack Size Availability Price Updated: 15-07-2024
GTPSINI-100 AFM probes, silicon nitride Cr/Au reflex coating Pack/100 3 weeks Quote only Quote
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GTPSINI-30 AFM probes, silicon nitride Cr/Au reflex coating Pack/50 3 weeks Quote only Quote
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GTPSINI-300 AFM probes, silicon nitride Cr/Au reflex coating Pack/300 3 weeks Quote only Quote
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