- Collections
SEM forensic sampling specimen mount, pin mount
The SEM specimen mount for forensic field sampling is made of certified aluminium alloy which does not contain elements that can interfere with the collected GSR evidence. Compatible with FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs.
Applications:
- Gunshot residue (GSR)
- Fibre collection
- Particle sampling
- Glass fragments
- Paint chips
- Powder samples
Size:
- 12.7mm diameter x 8mm pin
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 3 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
