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SEM specimen mounts for FIB applications, pin mount
The SEM specimen pin mounts with special low profile are available as flat, as a 90° mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made from aluminium with 3.2mm diameter pin stub. Compatible with FEI and TESCAN systems with the standard pin length and ZEISS/LEO systems with the short 6mm pin and with pin adapters in Hitachi and JEOL systems.
Styles:
- Flat mount with either 6mm or 8mm pin
- 90°with either 6mm or 8mm pin
- 38°for FEI Quanta and Helios Dualbeams
- 36°for ZEISS/LEO CrossBeam, NVISON, and AURIGA systems
- 35°for TESCAN LYRA and VELA FIBXSEM systems
| Code | Title | Size | Mount angle | Pack Size | Availability | Price | Updated: 08-05-2024 |
|---|---|---|---|---|---|---|---|
| GF321 | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 8mm | Flat | Pack/10 | 2 in stock | $56.00 AUD | |
| GF321-SP | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 6mm | Flat | Pack/10 | In Stock | $45.00 AUD | |
| GF322 | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 8mm | 90 deg. | Pack/10 | In Stock | $59.00 AUD | |
| GF322-SP | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 6mm | 90 deg. | Pack/10 | 3 weeks | $96.00 AUD | |
| GF323 | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 8mm | 38 deg. | Pack/10 | 3 weeks | $78.00 AUD | |
| GF324-SP | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 6mm | 36 deg. | Pack/10 | 3 weeks | $112.00 AUD | |
| GF325-SP | SEM specimen mounts for FIB applications, pin mount | 12.7mm dia. x 6mm | 35 deg. | Pack/10 | 3 weeks | $112.00 AUD | |
