Carbon SEM specimen mounts, pin mount

The carbon SEM specimen mounts are ideal for analytical SEM and microprobe work. Mounts are made from spectrographically pure graphite rods. Both electron and X-ray absorption is much higher than compared with aluminium or brass mounts, with lower level background radiation in X-ray spectra and lower level of electron scattering. A cost-efficient alternative are our Carbon Planchets which can be attached to standard aluminium SEM specimen mounts.

Specifications:

• Pin stub is 3.2mm diameter, 9mm length
• Total impurity level does not exceed 2ppm and typically less than 1ppm per element
• Compatible with FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs