Accessories and parts for PELCO tripod polishers

The PELCO Tripod Polishers were designed by researchers at the IBM East Fishkill Laboratory* to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.Features:Precise cross-sectioning at the TEM levelRepeatable and rapid production of TEM samplesReduces ion milling time to minutes as opposed to hoursProduces large thin areas over the entire specimen Read more