AFM probes, silicon nitride

The Silicon Nitride AFM probes for soft contact mode, made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. SiN (Si3N4) probes feature 4 cantilevers per chip. The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13°) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).Technical Data: SiNiCr/Au Reflex (C-GD) is coated with 70nm thick Chromium/GoldApplication for several measurement modes4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge TipSilicon Support Chip 3.4 mm x 1.6 mm x 0.45 mm