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PELCO X-CHECKER SEM calibration x-ray wafer references
The PELCO X-Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X-Checker Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations.
References includes:
- Copper disc to check spectral calibration
- Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution
- Nickel 400 mesh TEM grid for imaging calibration
- PTFE as a fluorine source to measure low energy resolution
- Carbon to monitor calibration at the low end of the spectrum for thin window detectors
- Aluminium foil disc
- Boron nitride to test low energy performance/peak separation
- 304 stainless steel for checking quantification
Instruction booklet and clamshell wafer storage case included.
* Availability Explanation
X weeks – the estimated lead time, based on the average time taken previously to fill orders from this particular supplier. Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
In Stock – Plenty of stock on the shelf, ready to ship.
No ETA – our supplier has advised they cannot provide an accurate ETA. Generally there is some issue with supply, and it may be more than 6 months.
