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SEM low profile 70 deg. specimen mount, pin mount
The SEM low profile 70° specimen mount is cut to allow advantageous specimen observation when using low working distance. Ideal for electron backscatter diffraction (EBSD) analysis. Made of aluminium with a machine grooved edge, 3.2mm diameter pin. Compatible with FEI, Tescan, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs.
Size:
- 12.7mm diameter x 9.5mm pin height
| Code | Pack Size | Availability | Price | Updated: 04-06-2026 |
|---|---|---|---|---|
| GTP16109 | Each | 0 in stock (?) | $23.00 AUD |
* Ordering Schedule
This item is available for back-order where 0 stock is listed.
We order from this manufacturer weekly, with an estimated lead time of 3 weeks.
This is the estimated lead time, based on the average time taken previously to fill orders from this particular supplier.
Lead times are from when we receive your order until when we fill your order. For delivery times, please see shipping information below.
