Silicon AFM probes, All-In-One
Silicon AFM probes, All-In-One
Silicon AFM probes, All-In-One
Silicon AFM probes, All-In-One
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Silicon AFM probes, All-In-One

The All-In-One series silicon AFM probes with four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. Made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200nm. Available with tip and without tip (tipless).See images for AFM probes coatings and application information.Technical Data: All-In-OneRotated Monolithic Silicon ProbeSymmetric Tip ShapeChip size: 3.4 x 1.6 x 0.3 mm

The All-In-One series silicon AFM probes with four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. Made of monolithic silicon fitting most commercial AFM's, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200nm. Available with tip and without tip (tipless).

See images for AFM probes coatings and application information.

Technical Data: All-In-One

  • Rotated Monolithic Silicon Probe
  • Symmetric Tip Shape
  • Chip size: 3.4 x 1.6 x 0.3 mm
        Cantilever A
 Cantilever B
 Cantilever C
 Cantilever D
Application Contact Mode
 Force modulation,
Pulsed Force Mode
 Soft Tapping Mode, Intermittent Contact-Mode
 Tapping Mode, Intermittent Contact-Mode
Similar type Contact Multi75 Tap150 Tap300

Values Range Values Range Values Range Values Range
Resonant freq. (kHz) 15 ±5  80 ±30
 150 ±80
 350 ±150
Force constant  (N/m) 0.2 0.04-0.07 2.7 0.4-10 7.4 1-29 40 7-160
Length (µm) 500 ±10
 210 ±10
 150 ±10
 100 ±10
Mean width              (µm) 30 ±5
 30 ±5
 30 ±5
 50 ±5
Thickness (µm) 2.7 ±1
 2.7 ±1
 2.7 ±1
 2.7 ±1
Tip height (µm) 17 (±2)
Tip set back (µm) 15 (±5)
Tip radius

< 10nm (G, AL-G), <25nm (Electri, DLC)
Half cone angle 20°-25° along cantilever axis,  25°-30° from side, 10°-at the apex
Code Title Coating Pack Size Availability Price Updated: 30-09-2024
GTPAIO-10 Silicon AFM probes, All-In-One None Pack/10 3 weeks Quote only Quote
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GTPAIO-50 Silicon AFM probes, All-In-One None Pack/50 3 weeks Quote only Quote
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GTPAIOAL-10 Silicon AFM probes, All-In-One Aluminium reflex coating Pack/10 3 weeks Quote only Quote
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GTPAIOAL-50 Silicon AFM probes, All-In-One Aluminium reflex coating Pack/50 3 weeks Quote only Quote
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GTPAIOAL-TL-10 Silicon AFM probes, All-In-One Aluminium reflex coating (tipless) Pack/10 3 weeks Quote only Quote
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GTPAIOAL-TL-50 Silicon AFM probes, All-In-One Aluminium reflex coating (tipless) Pack/50 3 weeks Quote only Quote
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GTPAIO-DLC-10 Silicon AFM probes, All-In-One DLC coating Pack/10 3 weeks Quote only Quote
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GTPAIO-DLC-50 Silicon AFM probes, All-In-One DLC coating Pack/50 3 weeks Quote only Quote
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GTPAIOE-10 Silicon AFM probes, All-In-One Conductive Cr/Pt Coating Pack/10 3 weeks Quote only Quote
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GTPAIOE-50 Silicon AFM probes, All-In-One Conductive Cr/Pt Coating Pack/50 3 weeks Quote only Quote
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GTPAIO-TL-10 Silicon AFM probes, All-In-One None (tipless) Pack/10 3 weeks Quote only Quote
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GTPAIO-TL-50 Silicon AFM probes, All-In-One None (tipless) Pack/50 3 weeks Quote only Quote
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